High-speed dynamic-mode atomic force microscopy imaging of polymers: an adaptive multiloop-mode approach

• Juan Ren and
• Qingze Zou

Beilstein J. Nanotechnol. 2017, 8, 1563–1570, doi:10.3762/bjnano.8.158

• Juan Ren Qingze Zou Department of Mechanical Engineering, Iowa State University, 2030 Black Engineering, Ames, IA 50011, USA Department of Mechanical and Aerospace Engineering, Rutgers University, 98 Brett Rd, Piscataway, NJ 08854, USA 10.3762/bjnano.8.158 Abstract Adaptive multiloop-mode (AMLM

• quality of the 25 Hz and 20 Hz AMLM imaging is at the same level of that of the 1 Hz TM imaging, while the tip–sample interaction force is substantially smaller than that of the 2 Hz TM imaging. Keywords: adaptive multiloop mode; atomic force microscopy (AFM); heterogeneous polymer sample; tapping-mode

• the capability of the AMLM technique in high-quality high-speed imaging on a wide variety of samples with largely different feature sizes and mechanical properties. Conclusion In this work, the performance of the adaptive multiloop-mode (AMLM) imaging technique has been tested and assessed via high